Studies of stacking-fault contrast by synchrotron X-ray section topography-Reference-Cited by-同舟云学术

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Studies of stacking-fault contrast by synchrotron X-ray section topography

Published:1989-10-01 Issue:5 Volume:22 Page:410-430
ISSN:0021-8898
Container-title:Journal of Applied Crystallography
language:
Short-container-title:J Appl Cryst

Author:

Kowalski G.,Lang A. R.,Makepeace A. P. W.,Moore M.

Publisher

International Union of Crystallography (IUCr)

Subject

General Biochemistry, Genetics and Molecular Biology

Link

http://journals.iucr.org/j/issues/1989/05/00/gl0102/gl0102.pdf

Cited by 27 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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