Skew-reflection X-ray microscopy of the vapor-growth surface of an Al2O single crystal-Reference-Cited by-同舟云学术

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Skew-reflection X-ray microscopy of the vapor-growth surface of an Al2O single crystal

Published:1973-12-01 Issue:6 Volume:6 Page:482-486
ISSN:0021-8898
Container-title:Journal of Applied Crystallography
language:
Short-container-title:J Appl Cryst

Author:

Farabaugh E. N.,Parker H. S.,Armstrong R. W.

Publisher

International Union of Crystallography (IUCr)

Subject

General Biochemistry, Genetics and Molecular Biology

Link

http://journals.iucr.org/j/issues/1973/06/00/a10555/a10555.pdf

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray extinction contrast in deformed single crystals;Journal of Applied Crystallography;1981-10-01

2. TECHNIQUES AND INTERPRETATION IN X-RAY TOPOGRAPHY;Diffraction and Imaging Techniques in Material Science;1978

3. Crystal Subgrain Misorientations Via X-ray Diffraction Microscopy;Advances in X-ray Analysis;1977

4. Preparation of polished substrates of BaF2;Journal of Applied Physics;1976-02

5. MELT, SOLID STATE AND VAPOUR GROWTH;X-ray Diffraction Topography;1976

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