Convergent-beam reflection high-energy electron diffraction (RHEED) observations from an Si(111) surface-Reference-Cited by-同舟云学术

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Convergent-beam reflection high-energy electron diffraction (RHEED) observations from an Si(111) surface

Published:1986-11-01 Issue:6 Volume:42 Page:569-577
ISSN:0108-7673
Container-title:Acta Crystallographica Section A Foundations of Crystallography
language:
Short-container-title:Acta Cryst Sect A

Author:

Lehmpfuhl G.,Dowell W. C. T.

Publisher

International Union of Crystallography (IUCr)

Subject

Structural Biology

Link

http://journals.iucr.org/a/issues/1986/06/00/a25439/a25439.pdf

Cited by 92 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An advanced three-dimensional RHEED mapping approach to the diffraction study of Co/MnF2/CaF2/Si(001) epitaxial heterostructures;Journal of Applied Crystallography;2016-08-24

2. Surface Channeling in Aberration-Corrected Scanning Transmission Electron Microscopy of Nanostructures;Microscopy and Microanalysis;2010-07-02

3. New approaches to the imaging of surface potentials;Journal of Physics: Condensed Matter;2001-11-12

4. ELECTRON STANDING WAVES AT A SURFACE DURING REFLECTION HIGH ENERGY ELECTRON DIFFRACTION AND APPLICATION TO STRUCTURE ANALYSIS;International Journal of Modern Physics B;2000-08-20

5. Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces;Surface Science;1999-11

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