Interpretation of diffractometer line profiles

Author:

Ladell J.,Parrish W.,Taylor J.

Publisher

International Union of Crystallography (IUCr)

Subject

General Earth and Planetary Sciences,General Environmental Science

Cited by 54 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Line-Profile Analysis Combined with Texture Analysis for Characterizing Dislocation Distribution in Texture Components of Cold-Rolled Copper Sheets;High Temperature Materials and Processes;2016-08-01

2. Interpretation of X-Ray Line Profile of Polycrystalline ${\hbox {MgB}}_{2}$;IEEE Transactions on Applied Superconductivity;2009-06

3. Characterization of Heteroepitaxial Layers;Heteroepitaxy of Semiconductors;2007-01-31

4. X-ray spectrometry of copper: New results on an old subject;Journal of Research of the National Institute of Standards and Technology;2004-01

5. Deconvolution of the instrumental functions in powder X-ray diffractometry;Journal of Applied Crystallography;2002-01-22

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