Author:
Kumar A.,Welzel U.,Mittemeijer E. J.
Abstract
A rigorous measurement strategy for (X-ray) diffraction stress measurements at fixed penetration/information depths has been developed. Thereby errors caused by lack of penetration-depth control in traditional (X-ray) diffraction (sin2ψ) measurements have been annulled. The range of accessible penetration/information depths and experimental aspects have been discussed. As a practical example, the depth gradient of the state of residual stress in a sputter-deposited nickel layer of 2 µm thickness has been investigated by diffraction stress measurements with uncontrolled penetration/information depth and two controlled penetration/information depths corresponding to about one quarter and one tenth of the layer thickness, respectively. The decrease of the planar tensile stress in the direction towards the surface could be well established quantitatively.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
73 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献