Angle calculations for a five-circle diffractometer used for surface X-ray diffraction-Reference-Cited by-同舟云学术

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Angle calculations for a five-circle diffractometer used for surface X-ray diffraction

Published:1987-10-01 Issue:5 Volume:20 Page:330-337
ISSN:0021-8898
Container-title:Journal of Applied Crystallography
language:
Short-container-title:J Appl Cryst

Author:

Vlieg E.,Van der Veen J. F.,Macdonald J. E.,Miller M.

Publisher

International Union of Crystallography (IUCr)

Subject

General Biochemistry, Genetics and Molecular Biology

Link

http://journals.iucr.org/j/issues/1987/05/00/a27777/a27777.pdf

Cited by 56 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X‐Ray Scattering and Imaging Studies of Electrode Structure and Dynamics;The Chemical Record;2018-09-24

2. Simulation of Surface Resonant X-ray Diffraction;Journal of Chemical Theory and Computation;2018-01-08

3. Thin-Film Growth and Oxidation of Surfaces Under Relevant Pressure Conditions;Encyclopedia of Interfacial Chemistry;2018

4. Multicircle Diffractometry Methods;Reference Module in Materials Science and Materials Engineering;2016

5. Six-circle diffractometer with atmosphere- and temperature-controlled sample stage and area and line detectors for use in the G2 experimental station at CHESS;Review of Scientific Instruments;2006-11

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