Author:
Kim Janghwan,Chung Yun Doo,Park Dae-young,Choi SooKyung,Shin Dong Wook,Soh Heun,Lee Hye Won,Son Wonseok,Yim Jeongbin,Park Chul-Seung,Kernan Maurice J.,Kim Changsoo
Publisher
Springer Science and Business Media LLC
Cited by
351 articles.
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