Abstract
AbstractEmerging functional materials such as halide perovskites are intrinsically unstable, causing long-term instability in optoelectronic devices made from these materials. This leads to difficulty in capturing useful information on device degradation through time-consuming optical characterization in their operating environments. Despite these challenges, understanding the degradation mechanism is crucial for advancing the technology towards commercialization. Here we present a self-supervised machine learning model that utilizes a multi-channel correlation and blind denoising to recover images without high-quality references, enabling fast and low-dose measurements. We perform operando luminescence mapping of various emerging optoelectronic semiconductors, including organic and halide perovskite photovoltaic and light-emitting devices. By tracking the spatially resolved degradation in electroluminescence of mixed-halide perovskite blue-light-emitting diodes, we discovered that lateral ion migration (perpendicular to the external electric field) during device operation triggers the formation of chloride-rich defective regions that emit poorly—a mechanism that would not be resolvable with conventional imaging approaches.
Publisher
Springer Science and Business Media LLC
Subject
Artificial Intelligence,Computer Networks and Communications,Computer Vision and Pattern Recognition,Human-Computer Interaction,Software
Cited by
4 articles.
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