Quantifying transmission electron microscopy irradiation effects using two-dimensional materials
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Physics and Astronomy
Link
http://www.nature.com/articles/s42254-019-0058-y.pdf
Reference119 articles.
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5. Egerton, R. F., McLeod, R., Wang, F. & Malac, M. Basic questions related to electron-induced sputtering in the TEM. Ultramicroscopy 110, 991–997 (2010).
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