Abstract
AbstractPhotolithography is the prevalent microfabrication technology. It needs to meet resolution and yield demands at a cost that makes it economically viable. However, conventional far-field photolithography has reached the diffraction limit, which imposes complex optics and short-wavelength beam source to achieve high resolution at the expense of cost efficiency. Here, we present a cost-effective near-field optical printing approach that uses metal patterns embedded in a flexible elastomer photomask with mechanical robustness. This technique generates sub-diffraction patterns that are smaller than 1/10th of the wavelength of the incoming light. It can be integrated into existing hardware and standard mercury lamp, and used for a variety of surfaces, such as curved, rough and defect surfaces. This method offers a higher resolution than common light-based printing systems, while enabling parallel-writing. We anticipate that it will be widely used in academic and industrial productions.
Publisher
Springer Science and Business Media LLC
Subject
General Physics and Astronomy,General Biochemistry, Genetics and Molecular Biology,General Chemistry
Reference57 articles.
1. Ito, T. & Okazaki, S. Pushing the limits of lithography. Nature 406, 1027–1031 (2000).
2. Kerkhof, Mvande et al. Enabling sub-10nm node lithography: presenting the NXE:3400B EUV scanner. Proc. SPIE 10143, 101430D (2017).
3. Wong, A. K. Resolution Enhancement Techniques in Optical Lithography (SPIE, 2001).
4. Massey, G. A. Microscopy and pattern generation with scanned evanescent waves. Appl. Opt. 23, 658–660 (1984).
5. Alkaisi, M. M., Blaikie, R. J. & McNab, S. J. Nanolithography in the evanescent near field. Adv. Mater. 13, 877–887 (2001).
Cited by
46 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献