Author:
Nakashima Seiji,Kimura Koji,Happo Naohisa,Ang Artoni Kevin R.,Yamamoto Yuta,Sekhar Halubai,Osaka Ai I.,Hayashi Koichi,Fujisawa Hironori
Abstract
AbstractA intermediate multidomain state and large crystallographic tilting of 1.78° for the (hh0)pc planes of a (001)pc-oriented single-domain Mn-doped BiFeO3 (BFMO) thin film were found when an electric field was applied along the [110]pc direction. The anomalous crystallographic tilting was caused by ferroelastic domain switching of the 109° domain switching. In addition, ferroelastic domain switching occurred via an intermediate multidomain state. To investigate these switching dynamics under an electric field, we used in situ fluorescent X-ray induced Kossel line pattern measurements with synchrotron radiation. In addition, in situ inverse X-ray fluorescence holography (XFH) experiments revealed that atomic displacement occurred under an applied electric field. We attributed the atomic displacement to crystallographic tilting induced by a converse piezoelectric effect. Our findings provide important insights for the design of piezoelectric and ferroelectric materials and devices.
Funder
Japan Society for the Promotion of Science
Publisher
Springer Science and Business Media LLC