Author:
Li Xingcai,Wang Juan,Zhang Jinghong
Abstract
AbstractWe investigate, both theoretically and numerically, the equivalence relationship between the positive and negative refraction index dielectric materials in electrostatic invisibility cloak. We have derived an analytical formula that enables fast calculate the corresponding positive dielectric constant from the negative refraction index material. The numerical results show that the negative refraction index material can be replaced by the positive refractive index materials in the static field cloak. This offers some new viewpoints for designing new sensing systems and devices in physics, colloid science, and engineering applications.
Funder
National Natural Science Foundation of China
the Leading Talents Program of Science and Technology innovation in Ningxia Province, in China
the CAS Light of West China Program
the Key Research and Development Program of Ningxia Province in China
The Natural Science Foundation of the Jiangsu Higher Education Institutions of China
Publisher
Springer Science and Business Media LLC
Cited by
2 articles.
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