Author:
Kesarwani Shankar,Misra Shobhna,Saha Dipankar,Della Rocca Maria Luisa,Roy Indrajit,Ganguly Swaroop,Mahajan Ashutosh
Abstract
AbstractA standard experimental setup for Inelastic Electron Tunneling Spectroscopy (IETS) performs the measurement of the second derivative of the current with respect to the voltage ($$d^2I/dV^2$$
d
2
I
/
d
V
2
) using a small AC signal and a lock-in based second harmonic detection. This avoids noise arising from direct differentiation of the current-voltage characteristics (I–V) by standard numerical methods. Here we demonstrate a noise-filtering algorithm based on Tikhonov Regularization to obtain IET spectra (i.e. $$d^2I/dV^2$$
d
2
I
/
d
V
2
vs. V) from measured DC I–V curves. This leads to a simple and effective numerical method for IETS extraction. We apply the algorithm to I–V data from a molecular junction and a metal-insulator-semiconductor tunneling device, demonstrating that the computed first/second derivatives have a workable match with those obtained from our lock-in measurements; the computed IET spectral peaks also correlate well with reported experimental ones. Finally, we present a scheme for automated tuning of the algorithm parameters well-suited for the use of this numerical protocol in real applications.
Funder
Ministry of Electronics and Information Technology, Government of India
Department of Science and Technology, Government of India
Vellore Institute of Technology, Vellore, India
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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