Author:
Wang Jintao,Wang Jianqiang,Duan Fangcheng,Chen Hongtao
Abstract
AbstractWith the development of high-integration and high-power electronics, the lack of matching chip connecting materials that can withstand high temperatures has been a challenge. In this manuscript, a Cu@Cu6Sn5 core–shell bimetallic particles (approx. 1 μm in diameter) are successfully prepared and introduced as a new solder material for the packaging of power devices to obtain a Cu3Sn all-IMC solder joint. The joint consisted mainly of equiaxed Cu3Sn grains, and a small portion of columnar Cu3Sn grains. In columnar-type growth, Sn is the dominant diffusing species, which comes from the depletion of Sn in Cu6Sn5. The depleted Cu6Sn5 is transformed into columnar Cu3Sn. In equiaxed-type growth, Cu is the dominant diffusing species. Cu reacts with Cu6Sn5 to grow a Cu3Sn layer. This conclusion was confirmed by the orientation relationship. The equiaxed Cu3Sn grain nucleates at the Cu/Cu3Sn interface have an orientation relationship with the Cu substrate. Columnar Cu3Sn grains at the Cu6Sn5/Cu3Sn interface have an orientation relationship with Cu6Sn5.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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