A moving contact line as a rheometer for nanometric interfacial layers-Reference-Cited by-同舟云学术

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A moving contact line as a rheometer for nanometric interfacial layers

Published:2016-08-26 Issue:1 Volume:7 Page:
ISSN:2041-1723
Container-title:Nature Communications
language:en
Short-container-title:Nat Commun

Author:

Lhermerout Romain,Perrin Hugo,Rolley Etienne,Andreotti Bruno,Davitt Kristina

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy,General Biochemistry, Genetics and Molecular Biology,General Chemistry

Link

http://www.nature.com/articles/ncomms12545.pdf

Reference39 articles.

1. de Gennes, P. G. Wetting: statics and dynamics. Rev. Mod. Phys. 57, 827–863 (1985).

2. Joanny, J.-F. & de Gennes, P. G. A model for contact angle hysteresis. J. Chem. Phys. 81, 552–562 (1984).

3. Delmas, M., Monthioux, M. & Ondarçuhu, T. Contact angle hysteresis at the nanometer scale. Phys. Rev. Lett. 106, 136102 (2011).

4. Davitt, K., Pettersen, M. S. & Rolley, E. Thermally activated wetting dynamics in the presence of surface roughness. Langmuir 29, 6884–6894 (2013).

5. Ramiasa, M., Ralston, J., Fetzer, R. & Sedev, R. The influence of topography on dynamic wetting. Adv. Colloid Interface Sci. 206, 275–293 (2014).

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