1. De Keyzer R.Proceedings 47th Annual Conference of ImagingScience and Technology, Rochester, NY, 1994; pp 22−23.
2. Geuens I.; Gijbels R.; De Keyzer R.; Verbeeck A.Proceedings 47thAnnual Conference of Imaging Science and technology, Rochester, NY, 1994; pp 27−30.
3. Geuens I.; Gijbels R.; Jacob W. InSecondary Ion Mass Spectrometry,SIMS VIII; Benninghoven, A., et al., Eds.; Wiley & Sons: Chichester, UK, 1992; pp 49−52.