Dielectric Characterization of Doped M5-Reference-Cited by-同舟云学术

Dielectric Characterization of Doped M5

Published:2008-08-12 Issue:35 Volume:112 Page:11049-11053
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Barbero G.¹,Freire F. C. M.¹,Vena C.¹,Versace C.¹

Affiliation:

1. Dipartimento di Fisica, Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Torino, Italia, Departamento de Física, Universidade Estadual de Maringá, Av. Colombo 5790, 87020-900, Maringá, PR, Brasil, and Licryl INFM-CNR Regional Laboratory and Centro di Eccellenza CEMIF.CA Dipartimento di Fisica, Universitá della Calabria, 87036 Arcavacata di Rende, Italy

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp8049685

Reference29 articles.

1. Conduction‐Induced Alignment of Nematic Liquid Crystals: Basic Model and Stability Considerations

2. Hydrodynamic instabilities of nematic liquid crystals under A. C. electric fields

3. Electromagnetic Hydrodynamics of Liquid Crystals

4. Electrohydrodynamic Instabilities in Doped M5 Nematic Liquid Crystals

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