Direct Assessment of Auger Recombination Rates of Charged Excitons <i>via</i> Opto-Electrical Measurements-Reference-Cited by-同舟云学术

Direct Assessment of Auger Recombination Rates of Charged Excitons via Opto-Electrical Measurements

Published:2023-05-02 Issue:5 Volume:10 Page:1638-1648
ISSN:2330-4022
Container-title:ACS Photonics
language:en
Short-container-title:ACS Photonics

Author:

Lee Hak June¹²,Rhee Seunghyun³,Jung Dongju¹,Park Jeong Woo¹,Shin Doyoon¹,Lim Jaemin¹,Im Seongbin¹,Chae Jong Ah¹,Char Kookheon²,Park Kyoungwon⁴,Lee Doh C.⁵^ORCID,Park Young-Shin⁶,Bae Wan Ki¹^ORCID

Affiliation:

1. SKKU Advanced Institute of Nanotechnology (SAINT), Department of Nano Science and Technology, Department of Nano Engineering, Sungkyunkwan University, Suwon 16419, Korea

2. School of Chemical and Biological Engineering, Seoul National University, Seoul 08826, Korea

3. Division of Advanced Materials, Korea Research Institute of Chemical Technology (KRICT), Daejeon 34113, Korea

4. Display Research Center, Korea Electronics Technology Institute (KETI), Seongnam 13509, Korea

5. Department of Chemical and Biomolecular Engineering, KAIST Institute for the Nanocentury, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea

6. Chemistry Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States

Funder

Samsung Advanced Institute of Technology

National Research Foundation of Korea

Ministry of Trade, Industry and Energy

Samsung Display

Publisher

American Chemical Society (ACS)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Biotechnology,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsphotonics.3c00280