Unraveling the Ultrafast Hot Electron Dynamics in Semiconductor Nanowires-Reference-Cited by-同舟云学术

Unraveling the Ultrafast Hot Electron Dynamics in Semiconductor Nanowires

Published:2021-01-13 Issue:1 Volume:15 Page:1133-1144
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Wittenbecher Lukas¹²³^ORCID,Viñas Boström Emil¹,Vogelsang Jan¹³,Lehman Sebastian¹³^ORCID,Dick Kimberly A.³⁴^ORCID,Verdozzi Claudio¹,Zigmantas Donatas²³^ORCID,Mikkelsen Anders¹³

Affiliation:

1. Department of Physics, Lund University, Box 118, 221 00 Lund, Sweden

2. Chemical Physics, Lund University, Box 124, 221 00 Lund, Sweden

3. Nano Lund, Lund University, Box 118, 221 00 Lund, Sweden

4. Centre for Analysis and Synthesis, Lund University, Box 124, 221 00 Lund, Sweden

Funder

Vetenskapsr?det

Crafoordska Stiftelsen

Knut och Alice Wallenbergs Stiftelse

NanoLund

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

http://pubs.acs.org/doi/pdf/10.1021/acsnano.0c08101

Reference87 articles.

1. Hot Electrons Do the Impossible: Plasmon-Induced Dissociation of H2 on Au

2. Distinguishing between plasmon-induced and photoexcited carriers in a device geometry

3. Quantifying hot carrier and thermal contributions in plasmonic photocatalysis

4. Photodetection with Active Optical Antennas

5. Hot-Electron Photodetection with a Plasmonic Nanostripe Antenna

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Time-resolved photoemission electron microscopy of semiconductor interfaces;Progress in Surface Science;2024-09

2. Ultrafast All-Optical Metasurfaces: Challenges and New Frontiers;ACS Photonics;2024-08-07

3. Influence of Auger heating and Shockley-Read-Hall recombination on hot-carrier dynamics in InGaAs nanowires;Physical Review B;2024-06-20

4. Picosecond carrier dynamics in InAs and GaAs revealed by ultrafast electron microscopy;Science Advances;2024-05-17

5. Real-Time Ab Initio Investigation on Hot Electron Relaxation Dynamics in Silicon;The Journal of Physical Chemistry Letters;2024-04-02