Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry-Reference-Cited by-同舟云学术

Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry

Published:2023-05-08 Issue:10 Volume:17 Page:9188-9196
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Kenaz Ralfy¹^ORCID,Ghosh Saptarshi¹^ORCID,Ramachandran Pradheesh¹^ORCID,Watanabe Kenji²^ORCID,Taniguchi Takashi³^ORCID,Steinberg Hadar¹^ORCID,Rapaport Ronen¹^ORCID

Affiliation:

1. Racah Institute of Physics, The Hebrew University of Jerusalem, Jerusalem 9190401, Israel

2. Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan

3. International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan

Funder

United States-Israel Binational Science Foundation

Israel Science Foundation

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.2c12773

Reference70 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

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4. Signatures of a degenerate many-body state of interlayer excitons in a van der Waals heterostack

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