Cationic Clathrate I Si46-xPxTey (6.6(1) ≤ y ≤ 7.5(1), x ≤ 2y): Crystal Structure, Homogeneity Range, and Physical Properties-Reference-Cited by-同舟云学术

Cationic Clathrate I Si46-xPxTey (6.6(1) ≤ y ≤ 7.5(1), x ≤ 2y): Crystal Structure, Homogeneity Range, and Physical Properties

Published:2009-03-12 Issue:8 Volume:48 Page:3720-3730
ISSN:0020-1669
Container-title:Inorganic Chemistry
language:en
Short-container-title:Inorg. Chem.

Author:

Zaikina J. V.¹,Kovnir K. A.¹,Burkhardt U.¹,Schnelle W.¹,Haarmann F.¹,Schwarz U.¹,Grin Yu.¹,Shevelkov A. V.¹

Affiliation:

1. Chemistry Department, Lomonosov Moscow State University, 119991 Moscow, Russia, and Max-Planck-Institut für Chemische Physik fester Stoffe, 01187 Dresden, Germany

Publisher

American Chemical Society (ACS)

Subject

Inorganic Chemistry,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ic8023887

Reference53 articles.

1. Clathrate Structure of Silicon Na 8 Si 46 and Na x Si 136 ( x < 11)

2. Semiconducting clathrates: synthesis, structure and properties

3. K7B7Si39, a Borosilicide with the Clathrate I Structure

4. Structure and Thermoelectric Characterization of AxBa8-xAl14Si31 (A = Sr, Eu) Single Crystals

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