Thickness-Independent Semiconducting-to-Metallic Conversion in Wafer-Scale Two-Dimensional PtSe2 Layers by Plasma-Driven Chalcogen Defect Engineering

Author:

Shawkat Mashiyat Sumaiya12ORCID,Gil Jaeyoung3,Han Sang Sub14,Ko Tae-Jun1,Wang Mengjing1ORCID,Dev Durjoy12,Kwon Junyoung5,Lee Gwan-Hyoung4ORCID,Oh Kyu Hwan4,Chung Hee-Suk6,Roy Tania127ORCID,Jung YounJoon3ORCID,Jung Yeonwoong127ORCID

Affiliation:

1. NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, United States

2. Department of Electrical and Computer Engineering, University of Central Florida, Orlando, Florida 32816, United States

3. Department of Chemistry, Seoul National University, Seoul 08826, South Korea

4. Department of Materials Science and Engineering, Seoul National University, Seoul 08826, South Korea

5. Department of Materials Science and Engineering, Yonsei University, Seoul 03722, South Korea

6. Analytical Research Division, Korea Basic Science Institute, Jeonju 54907, South Korea

7. Department of Materials Science and Engineering, University of Central Florida, Orlando, Florida 32816, United States

Funder

University of Central Florida

National Research Foundation of Korea

Korea Institute of Energy Technology Evaluation and Planning

Division of Civil, Mechanical and Manufacturing Innovation

Seoul National University

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

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