Direct Observation and Analysis of Annealing-Induced Microstructure at Interface and Its Effect on Performance Improvement of Organic Thin Film Transistors-Reference-Cited by-同舟云学术

Direct Observation and Analysis of Annealing-Induced Microstructure at Interface and Its Effect on Performance Improvement of Organic Thin Film Transistors

Published:2008-09-05 Issue:39 Volume:112 Page:12270-12278
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Bao Qiaoliang¹,Li Jun¹,Li Chang Ming¹,Dong Zhi Li¹,Lu Zhisong¹,Qin Fang¹,Gong Cheng¹,Guo Jun¹

Affiliation:

1. School of Chemical and Biomedical Engineering and Center for Advanced Bionanosystems, Nanyang Technological University, Singapore, 639798, Singapore, and School of Materials Science and Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp804988h

Reference59 articles.

1. Electroluminescence in conjugated polymers

2. Semiconducting and Metallic Polymers: The Fourth Generation of Polymeric Materials (Nobel Lecture)

3. Efficient Near-Infrared Polymer Nanocrystal Light-Emitting Diodes

4. Hybrid Nanorod-Polymer Solar Cells

5. Plastic Solar Cells

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