Characterization of Monolayer Formation on Aluminum-Doped Zinc Oxide Thin Films-Reference-Cited by-同舟云学术

Characterization of Monolayer Formation on Aluminum-Doped Zinc Oxide Thin Films

Published:2007-12-11 Issue:2 Volume:24 Page:433-440
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Rhodes Crissy L.¹,Lappi Simon¹,Fischer Daniel¹,Sambasivan Sharadha¹,Genzer Jan¹,Franzen Stefan¹

Affiliation:

1. Department of Chemistry, North Carolina State University, Raleigh, North Carolina 27695-8204, Department of Chemical & Biomolecular Engineering, North Carolina State University, Raleigh, North Carolina 27695-7905, and National Institute of Standards and Technology, Gaithersburg, Maryland 20899

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la701741m

Reference75 articles.

1. Controlling DNA Orientation on Mixed ssDNA/OEG SAMs

2. Structure and growth of self-assembling monolayers

3. Formation and Structure of Self-Assembled Monolayers

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