Electric Field and Size Effects on Atomic Structures and Conduction Properties of Ultrathin Cu Nanowires-Reference-Cited by-同舟云学术

Electric Field and Size Effects on Atomic Structures and Conduction Properties of Ultrathin Cu Nanowires

Published:2011-02-09 Issue:8 Volume:115 Page:3327-3331
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

He Cheng¹,Zhang Wenxue²,Deng Juanli²³

Affiliation:

1. State Key Laboratory for Mechanical Behavior of Materials, School of Materials Science and Engineering, Xi’an Jiaotong University, Xi’an 710049, China

2. School of Materials Science and Engineering, Chang’an University, Xi’an 710064, China

3. School of Natural and Applied Sciences, Northwestern Polytechnical University, Xi’an 710072, China

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp1119876

Reference35 articles.

1. Surface Plasmon Resonances of Cu Nanowire Arrays

2. 10-nm-thick quinary (AlCrTaTiZr)N film as effective diffusion barrier for Cu interconnects at 900 °C

3. Electron Scattering and Electrical Conductance in Polycrystalline Metallic Films and Wires: Impact of Grain Boundary Scattering Related to Melting Point

4. Quantized conductance in an atom-sized point contact

5. Quantized conductance of point contacts in a two-dimensional electron gas

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