Radiation-Induced Damage and Recovery of Ultra-Nanocrystalline Diamond: Toward Applications in Harsh Environments-Reference-Cited by-同舟云学术

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Radiation-Induced Damage and Recovery of Ultra-Nanocrystalline Diamond: Toward Applications in Harsh Environments

Published:2017-10-31 Issue:45 Volume:9 Page:39790-39794
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Martin Aiden A.¹^ORCID,Filevich Jorge²,Straw Marcus²,Randolph Steven²,Botman Aurélien²,Aharonovich Igor³^ORCID,Toth Milos³^ORCID

Affiliation:

1. Physical and Life Sciences Directorate, Lawrence Livermore National Laboratory, Livermore, California 94550, United States

2. Thermo Fisher Scientific, 5350 Northeast Dawson Creek Drive, Hillsboro, Oregon 97214-5793, United States

3. School of Physics and Advanced Materials, University of Technology Sydney, 15 Broadway, Ultimo, New South Wales 2007, Australia

Funder

Thermo Fisher Scientific

Australian Research Council

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.7b12240

Reference34 articles.

1. Status review of the science and technology of ultrananocrystalline diamond (UNCD™) films and application to multifunctional devices

2. Ultrananocrystalline diamond thin films for MEMS and moving mechanical assembly devices

3. Mechanical stiffness and dissipation in ultrananocrystalline diamond microresonators

4. Low temperature hot filament chemical vapor deposition of Ultrananocrystalline Diamond films with tunable sheet resistance for electronic power devices

5. Synthesis and field emission properties of hybrid structures of ultrananocrystalline diamond and vertically aligned carbon nanofibers

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Review—Radiation Damage in Wide and Ultra-Wide Bandgap Semiconductors;ECS Journal of Solid State Science and Technology;2021-05-01

2. Use of X-ray photoelectron spectroscopy and spectroscopic ellipsometry to characterize carbonaceous films modified by electrons and hydrogen atoms;Applied Surface Science;2019-06

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