Charge Transfer Characterization of ALD-Grown TiO2 Protective Layers in Silicon Photocathodes-Reference-Cited by-同舟云学术

Charge Transfer Characterization of ALD-Grown TiO2 Protective Layers in Silicon Photocathodes

Published:2017-05-18 Issue:21 Volume:9 Page:17932-17941
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Ros Carles¹^ORCID,Andreu Teresa¹²^ORCID,Hernández-Alonso María Dolores³,Penelas-Pérez Germán³,Arbiol Jordi⁴⁵^ORCID,Morante Joan R.¹²

Affiliation:

1. Catalonia Institute for Energy Research (IREC), Jardins de les Dones de Negre 1, Sant Adrià del Besòs, 08930 Barcelona, Spain

2. Universitat de Barcelona (UB), Martí i Franquès, 1, 08028 Barcelona, Spain

3. Repsol Technology Center, Agustín de Betancourt, s/n, Móstoles, 28935 Madrid, Spain

4. Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and The Barcelona Institute of Science and Technology (BIST), Campus UAB, Bellaterra, 08193 Barcelona, Spain

5. ICREA, Pg. Lluís Companys 23, 08010 Barcelona, Spain

Funder

European Regional Development Fund

Ministerio de Econom?a y Competitividad

Secretar?a de Estado de Investigaci?n, Desarrollo e Innovaci?n

Generalitat de Catalunya

Repsol S.A.

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.7b02996

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