Effect of an Interfacial Layer on Electron Tunneling through Atomically Thin Al2O3 Tunnel Barriers
Author:
Affiliation:
1. Department of Physics and Astronomy, University of Kansas, Lawrence, Kansas 66045, United States
2. Department of Physics, Astronomy and Materials Science, Missouri State University, Springfield, Missouri 65897, United States
Funder
Army Research Office
National Aeronautics and Space Administration
Division of Materials Research
Publisher
American Chemical Society (ACS)
Subject
General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/acsami.7b12170
Reference49 articles.
1. Physics and Applications of the Josephson Effect
2. Magnetic tunnel junctions
3. The use of Simmons’ equation to quantify the insulating barrier parameters in Al/AlOx/Al tunnel junctions
4. Measurements of tunneling barrier thicknesses for Nb/Al–AlO /Nb tunnel junctions
5. Atomic and electronic structure of ultra-thin Al/AlOx/Al interfaces
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