Low Thermal Boundary Resistance Interfaces for GaN-on-Diamond Devices

Author:

Yates Luke,Anderson Jonathan1,Gu Xing2,Lee Cathy2,Bai Tingyu3,Mecklenburg Matthew4,Aoki Toshihiro5,Goorsky Mark S.3,Kuball Martin6,Piner Edwin L.1,Graham SamuelORCID

Affiliation:

1. Texas State University, San Marcos, Texas 78666, United States

2. Qorvo Inc., 500 W. Renner Road, Richardson, Texas 75080, United States

3. Materials Science and Engineering, University of California, Los Angeles, Los Angeles, California 90095, United States

4. Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, California 90089, United States

5. Irvine Materials Research Institute, University of California, Irvine, California 92697, United States

6. Center for Device Thermography and Reliability, University of Bristol, Bristol BS8 1TL, U.K.

Funder

Defense Advanced Research Projects Agency

Division of Graduate Education

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

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