Direct Evidence of Ion-Migration-Induced Degradation of Ultrabright Perovskite Light-Emitting Diodes-Reference-Cited by-同舟云学术

Direct Evidence of Ion-Migration-Induced Degradation of Ultrabright Perovskite Light-Emitting Diodes

Published:2019-03-05 Issue:12 Volume:11 Page:11667-11673
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Lee Hyunho¹^ORCID,Ko Donghyun¹,Lee Changhee¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, Inter-University Semiconductor Research Center, Seoul National University, Seoul 08826, Republic of Korea

Funder

National Research Foundation of Korea

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.8b22217

Reference22 articles.

1. Bright light-emitting diodes based on organometal halide perovskite

2. High-efficiency perovskite–polymer bulk heterostructure light-emitting diodes

3. Perovskite light-emitting diodes based on spontaneously formed submicrometre-scale structures

4. Perovskite light-emitting diodes with external quantum efficiency exceeding 20 per cent

5. Overcoming the electroluminescence efficiency limitations of perovskite light-emitting diodes

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