Direct Measurement of the Magnitude of the van der Waals Interaction of Single and Multilayer Graphene-Reference-Cited by-同舟云学术

Direct Measurement of the Magnitude of the van der Waals Interaction of Single and Multilayer Graphene

Published:2018-09-23 Issue:41 Volume:34 Page:12335-12343
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Chiou Yu-Cheng¹,Olukan Tuza Adeyemi²,Almahri Mariam Ali²,Apostoleris Harry²,Chiu Cheng Hsiang²,Lai Chia-Yun³^ORCID,Lu Jin-You²,Santos Sergio⁴,Almansouri Ibraheem²,Chiesa Matteo²³

Affiliation:

1. Topco Scientific Co. Ltd., No. 483, Sec. 2, Tiding Blvd., Neihu, Taipei City 11493, Taiwan

2. Laboratory for Energy and NanoScience (LENS), Khalifa University of Science and Technology, Masdar Institute Campus, Abu Dhabi 54224, UAE

3. Arctic Renewable Energy Center (ARC), Department of Physics and Technology, UiT The Artic University of Norway, 9037 Tromsø, Norway

4. Future Synthesis AS, Uniongata 18, 3732 Skien, Norway

Funder

Khalifa University of Science, Technology and Research

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.langmuir.8b02802

Reference43 articles.

1. Two-dimensional atomic crystals

2. Electric Field Effect in Atomically Thin Carbon Films

3. Van der Waals heterostructures

4. Emergence of superlattice Dirac points in graphene on hexagonal boron nitride

5. Structural and electronic properties ofh-BN

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