Porosity and Mechanical Properties of Mesoporous Thin Films Assessed by Environmental Ellipsometric Porosimetry-Reference-Cited by-同舟云学术

Porosity and Mechanical Properties of Mesoporous Thin Films Assessed by Environmental Ellipsometric Porosimetry

Published:2005-11-23 Issue:26 Volume:21 Page:12362-12371
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Boissiere Cédric¹,Grosso David¹,Lepoutre Sophie¹,Nicole Lionel¹,Bruneau Aline Brunet¹,Sanchez Clément¹

Affiliation:

1. Laboratoire de Chimie de la Matière Condensée, Université Pierre et Marie Curie, 4 Place Jussieu, 75252 Paris, Cedex 5, France, and Institut des Nanosciences de Paris, UMR CNRS 7601, Universite Paris 6, Campus Boussicaut, 140 Rue Lourmel, 75015 Paris, France

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la050981z

Reference38 articles.

1. Structural Characterization of Mesoporous Organosilica Films for Ultralow-k Dielectrics

2. Mesoporous silica thin films for alcohol sensors

3. Pulsed laser deposition of mesoporous niobium oxide thin films and application as chemical sensors

4. Advanced selective optical sensors based on periodically organized mesoporous hybrid silica thin films

5. Determination of pore size distribution in thin films by ellipsometric porosimetry

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