Direct Characterization of Buried Interfaces in 2D/3D Heterostructures Enabled by GeO<sub>2</sub> Release Layer-Reference-Cited by-同舟云学术

Direct Characterization of Buried Interfaces in 2D/3D Heterostructures Enabled by GeO₂ Release Layer

Published:2024-01-03 Issue:2 Volume:16 Page:2847-2860
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Smyth Christopher M.¹^ORCID,Cain John M.¹^ORCID,Boehm Alex¹^ORCID,Ohlhausen James A.¹,Lam Mila Nhu¹^ORCID,Yan Xiaodong²,Liu Stephanie E.²,Zeng Thomas T.²,Sangwan Vinod K.²^ORCID,Hersam Mark C.²³⁴^ORCID,Chou Stanley S.¹,Ohta Taisuke¹^ORCID,Lu Tzu-Ming¹⁵^ORCID

Affiliation:

1. Sandia National Laboratories, Albuquerque, New Mexico 87185, United States

2. Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States

3. Department of Chemistry, Northwestern University, Evanston, Illinois 60208, United States

4. Department of Electrical and Computer Engineering, Northwestern University, Evanston, Illinois 60208, United States

5. Center for Integrated Nanotechnologies (CINT), Sandia National Laboratories, Albuquerque, New Mexico 87123, United States

Funder

Sandia National Laboratories

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.3c12849

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