Evaluation of an X-ray-Excited Optical Microscope for Chemical Imaging of Metal and Other Surfaces

Author:

Sabbe Pieter-Jan1,Dowsett Mark2,Hand Matthew2,Grayburn Rosie12,Thompson Paul34,Bras Wim5,Adriaens Annemie1

Affiliation:

1. Department of Analytical Chemistry, Ghent University, Krijgslaan 281-S12, B-9000 Ghent, Belgium

2. Department of Physics, University of Warwick, Coventry CV4 7AL, United Kingdom

3. XMaS—The UK CRG, ESRF—The European Synchrotron, CS40220, 38043 Grenoble Cedex 9, France

4. Department of Physics, University of Liverpool, Liverpool L69 7ZX, United Kingdom

5. Netherlands Organisation for Scientific Research (NWO) DUBBLE@ESRF CS40220, 38043 Grenoble Cedex 9, France

Funder

Engineering and Physical Sciences Research Council

Royal Society

Fonds Wetenschappelijk Onderzoek

Universiteit Gent

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

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