Identification of (Tb,Eu)9.43(SiO4)6O2−δ Oxy-Apatite Structures as Nanometric Inclusions in Annealed (Eu,Tb)-Doped ZnO/Si Junctions: Combined Electron Diffraction and Chemical Contrast Imaging Studies-Reference-Cited by-同舟云学术

Identification of (Tb,Eu)9.43(SiO4)6O2−δ Oxy-Apatite Structures as Nanometric Inclusions in Annealed (Eu,Tb)-Doped ZnO/Si Junctions: Combined Electron Diffraction and Chemical Contrast Imaging Studies

Published:2021-03-11 Issue:7 Volume:60 Page:4508-4516
ISSN:0020-1669
Container-title:Inorganic Chemistry
language:en
Short-container-title:Inorg. Chem.

Author:

Leroux Chris¹,Guillaume Clément²,Labbé Christophe²^ORCID,Portier Xavier²,Pelloquin Denis¹^ORCID

Affiliation:

1. CRISMAT, UMR CNRS 6508, ENSICAEN, Normandie Université, 6 Boulevard du Maréchal Juin, Caen Cedex 04 14050, France

2. CIMAP, CEA, UMR CNRS 6252, ENSICAEN, Normandie Université, 6 Boulevard du Maréchal Juin, Caen Cedex 04 14050, France

Funder

Agence Nationale de la Recherche

European Regional Development Fund

R?gion Normandie

Publisher

American Chemical Society (ACS)

Subject

Inorganic Chemistry,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.inorgchem.0c03361

Reference40 articles.

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5. Davesnne, C. Elaboration et caractérisation de films de ZnO dopé pour des applications optoélectroniques. Ph.D. Thesis, Université de Caen Basse Normandie, 2014.

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