Fabrication and Characterization of Electrodeposited Bismuth Telluride Films and Nanowires-Reference-Cited by-同舟云学术

Fabrication and Characterization of Electrodeposited Bismuth Telluride Films and Nanowires

Published:2010-02-08 Issue:8 Volume:114 Page:3385-3389
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Chen Cheng-Lung¹,Chen Yang-Yuan¹,Lin Su-Jien¹,Ho James C.¹,Lee Ping-Chung¹,Chen Chii-Dong¹,Harutyunyan Sergey R.¹

Affiliation:

1. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan, Republic of China, Institute of Physics, Academia Sinica, Taipei, Taiwan, Republic of China, and Institute for Physical Research, NAS, Ashtarak-2, Armenia

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp909926z

Reference38 articles.

1. Smaller Is Cooler

2. Monolithically integrated thermoelectric controlled laser diode

3. Holey and Unholey Semiconductors

4. Thin-film thermoelectric devices with high room-temperature figures of merit

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