Analyzing Fundamental Properties of Two-Dimensional Materials by Raman Spectroscopy from Microscale to Nanoscale-Reference-Cited by-同舟云学术

Analyzing Fundamental Properties of Two-Dimensional Materials by Raman Spectroscopy from Microscale to Nanoscale

Published:2023-07-10 Issue:29 Volume:95 Page:10821-10838
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Wu Heng¹²,Lin Miao-Ling¹^ORCID,Zhou Yan¹,Zhang Xin¹^ORCID,Tan Ping-Heng¹²^ORCID

Affiliation:

1. State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China

2. Center of Materials Science and Optoelectronics Engineering & CAS Center of Excellence in Topological Quantum Computation, University of Chinese Academy of Sciences, Beijing 100049, China

Funder

National Natural Science Foundation of China

Chinese Academy of Sciences

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.3c00272

Reference159 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

2. Atomically ThinMoS2: A New Direct-Gap Semiconductor

3. Emerging Photoluminescence in Monolayer MoS2

4. Electronics and optoelectronics of two-dimensional transition metal dichalcogenides

5. 2D transition metal dichalcogenides

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