Embedded Silicon Nanocrystals Studied by Photoluminescence and Raman Spectroscopies: Exciton and Phonon Confinement Effects-Reference-Cited by-同舟云学术

Embedded Silicon Nanocrystals Studied by Photoluminescence and Raman Spectroscopies: Exciton and Phonon Confinement Effects

Published:2010-09-27 Issue:41 Volume:114 Page:17344-17349
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Miska Patrice¹,Dossot Manuel¹,Nguyen Thi D.¹,Grün Matthias¹,Rinnert Hervé¹,Vergnat Michel¹,Humbert Bernard¹

Affiliation:

1. Institut Jean Lamour, UMR 7198 CNRS, Nancy Université, UPV Metz, Faculté des Sciences et Technologies, Bvd des Aiguillettes, B.P. 70239, F-54506 Vandœuvre-lès-Nancy Cedex, France, Laboratoire de Chimie Physique et Microbiologie pour l’Environnement LCPME, UMR 7564 CNRS, Nancy Université 405, rue de Vandoeuvre, F-54600 Villers-lès-Nancy, France, and Institut des Matériaux Jean Rouxel (IMN), UMR 6502 CNRS, Université de Nantes, 2 rue de la Houssinière, B.P. 32229, F-44322 Nantes Cedex 3, France

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp1044095

Reference18 articles.

1. Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

2. Analysis of the stretched exponential photoluminescence decay from nanometer-sized silicon crystals in SiO2

3. Influence of average size and interface passivation on the spectral emission of Si nanocrystals embedded in SiO2

4. Optical properties of silicon nanoclusters fabricated by ion implantation

5. Correlation between luminescence and structural properties of Si nanocrystals

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