1. Ultimate Scaling of CMOS Logic Devices with Ge and III–V Materials
2. Ashley, T.; Barnes, A. R.; Buckle, L.; Dean, A. B.; Emeny, M. T.; Fearn, M.; Hayes, D. G.; Hilton, K. P.; Jefferies, R.; Martin, T.; Nash, K. J.; Philips, T. J.; Tang, W. H. A.; Wilding, P. J.; Chau, R.7th Int. Conf. Solid-State Integrated Circuits Technol. Proc. 2004, 3, 2253−2256.
3. Infrared detectors: status and trends
4. Giant, Level-Dependent g Factors in InSb Nanowire Quantum Dots