Direct Measurement of the Electron Beam Spatial Intensity Profile via Carbon Nanotube Tomography
Author:
Affiliation:
1. Colleges of Nanoscale Science and Engineering, SUNY-Polytechnic Institute, Albany, New York 12203, United States
Funder
U.S. Naval Research Laboratory
Division of Electrical, Communications and Cyber Systems
Publisher
American Chemical Society (ACS)
Subject
Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.9b01228
Reference33 articles.
1. Scanning Transmission Electron Microscopy
2. Improving Scanning Electron Microscope Resolution for Near Planar Samples Through the Use of Image Restoration
3. A method for calculating the current density of charged particle beams and the effect of finite source size and spherical and chromatic aberrations on the focusing characteristics
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