Transmission-Electron-Microscopy-Generated Atomic Defects in Two-Dimensional Nanosheets and Their Integration in Devices for Electronic and Optical Sensing-Reference-Cited by-同舟云学术

Transmission-Electron-Microscopy-Generated Atomic Defects in Two-Dimensional Nanosheets and Their Integration in Devices for Electronic and Optical Sensing

Published:2022-08-15 Issue:8 Volume:5 Page:11429-11436
ISSN:2574-0970
Container-title:ACS Applied Nano Materials
language:en
Short-container-title:ACS Appl. Nano Mater.

Author:

Quincke Moritz¹^ORCID,Lehnert Tibor¹,Keren Itai²,Moses Badlyan Narine³^ORCID,Port Fabian⁴,Goncalves Manuel⁴,Mohn Michael J.¹,Maultzsch Janina³,Steinberg Hadar²^ORCID,Kaiser Ute¹

Affiliation:

1. Central Facility Electron Microscopy, Materials Science Electron Microscopy, Ulm University, 89081 Ulm, Germany

2. The Racah Institute of Physics, The Hebrew University of Jerusalem, Jerusalem 9190401, Israel

3. Department of Physics, Friedrich-Alexander-Universität Erlangen-Nürnberg, 91058 Erlangen, Germany

4. Institute of Experimental Physics, Ulm University, 89081 Ulm, Germany

Funder

Carl-Zeiss-Stiftung

Israel Science Foundation

Deutsche Forschungsgemeinschaft

H2020 Future and Emerging Technologies

Publisher

American Chemical Society (ACS)