Thin Film Structure of Tetraceno[2,3-b]thiophene Characterized by Grazing Incidence X-ray Scattering and Near-Edge X-ray Absorption Fine Structure Analysis-Reference-Cited by-同舟云学术

Thin Film Structure of Tetraceno[2,3-b]thiophene Characterized by Grazing Incidence X-ray Scattering and Near-Edge X-ray Absorption Fine Structure Analysis

Published:2008-02-23 Issue:11 Volume:130 Page:3502-3508
ISSN:0002-7863
Container-title:Journal of the American Chemical Society
language:en
Short-container-title:J. Am. Chem. Soc.

Author:

Yuan Quan¹,Mannsfeld Stefan C. B.¹,Tang Ming L.¹,Toney Michael F.¹,Lüning Jan¹,Bao Zhenan¹

Affiliation:

1. Department of Materials Science and Engineering, Department of Chemical Engineering, and Department of Chemistry, Stanford University, California 94305, and Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, 2575 Sand Hill Road, M/S 69, Menlo Park, California 94025

Publisher

American Chemical Society (ACS)

Subject

Colloid and Surface Chemistry,Biochemistry,General Chemistry,Catalysis

Link

https://pubs.acs.org/doi/pdf/10.1021/ja0773002

Reference44 articles.

1. Ultralow-power organic complementary circuits

2. Organic thin-film transistor-driven polymer-dispersed liquid crystal displays on flexible polymeric substrates

3. High-Resolution Inkjet Printing of All-Polymer Transistor Circuits

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