Meta-Learned and TCAD-Assisted Sampling in Semiconductor Laser Annealing-Reference-Cited by-同舟云学术

Meta-Learned and TCAD-Assisted Sampling in Semiconductor Laser Annealing

Published:2022-12-22 Issue:1 Volume:8 Page:737-746
ISSN:2470-1343
Container-title:ACS Omega
language:en
Short-container-title:ACS Omega

Author:

Rawat Tejender Singh¹^ORCID,Chang Chung Yuan¹^ORCID,Feng Yen-Wei¹^ORCID,Chen ShihWei²^ORCID,Shen Chang-Hong²,Shieh Jia-Min²^ORCID,Lin Albert Shihchun¹^ORCID

Affiliation:

1. Institute of Electronics Engineering, National Yang Ming Chiao Tung University, 300, Hsinchu City30010, Taiwan, R.O.C

2. Taiwan Semiconductor Research Institute, No. 26, Prosperity Road I, Hsinchu Science Park, Hsinchu City300091, Taiwan, R.O.C

Funder

Ministry of Science and Technology, Taiwan

Publisher

American Chemical Society (ACS)

Subject

General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acsomega.2c06000

Reference52 articles.

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3. An Adaptive Machine Learning Method Based on Finite Element Analysis for Ultra Low-k Chip Package Design

4. Evaluation of Sampling and Cross-Validation Tuning Strategies for Regional-Scale Machine Learning Classification

5. Recent advances in scaling-down sampling methods in machine learning

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