AFM Force Measurements between SAM-Modified Tip and SAM-Modified Substrate in Alkaline Solution
Author:
Affiliation:
1. Department of Chemistry and Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/jp044655o
Reference61 articles.
1. Chemical and Biochemical Analysis Using Scanning Force Microscopy
2. Force-distance curves by atomic force microscopy
3. Force Spectroscopy of Molecular Systems—Single Molecule Spectroscopy of Polymers and Biomolecules
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