Semi-Metal Edge Contact for Barrier-Free Carrier Transport in MoS2 Field Effect Transistors

Author:

Lee Sungwon1,Wang Xinbiao1,Shin Hoseong1,Ali Nasir1ORCID,Ngo Tien Dat1,Hwang Euyheon1,Kim Gil-Ho12ORCID,Yeom Geun Young13ORCID,Watanabe Kenji4ORCID,Taniguchi Takashi4ORCID,Yoo Won Jong1ORCID

Affiliation:

1. SKKU Advanced Institute of Nano Technology, Sungkyunkwan University, Suwon, Gyeonggi-do 16419, Republic of Korea

2. School of Electronic and Electrical Engineering, Sungkyunkwan University, 2066 Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Republic of Korea

3. School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066 Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Republic of Korea

4. National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan

Funder

National Research Foundation of Korea

Ministry of Trade, Industry and Energy

Publisher

American Chemical Society (ACS)

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