Time Neighborhood Preserving Embedding Model and Its Application for Fault Detection-Reference-Cited by-同舟云学术

Time Neighborhood Preserving Embedding Model and Its Application for Fault Detection

Published:2013-09-10 Issue:38 Volume:52 Page:13717-13729
ISSN:0888-5885
Container-title:Industrial & Engineering Chemistry Research
language:en
Short-container-title:Ind. Eng. Chem. Res.

Author:

Miao Aimin¹,Ge Zhiqiang¹,Song Zhihuan¹,Zhou Le¹

Affiliation:

1. State Key Laboratory of Industrial Control Technology, Institute of Industrial Process Control, Department of Control Science and Engineering, Zhejiang University, Hangzhou, Zhejiang, P. R.China

Publisher

American Chemical Society (ACS)

Subject

Industrial and Manufacturing Engineering,General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ie400854f

Reference33 articles.

1. Survey on data-driven industrial process monitoring and diagnosis

2. Monitoring, fault diagnosis, fault-tolerant control and optimization: Data driven methods

3. Review of Recent Research on Data-Based Process Monitoring

4. Improved kernel PCA-based monitoring approach for nonlinear processes

5. A novel fault diagnosis system using pattern classification on kernel FDA subspace

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