Assessment of Robustness to Temperature in a Negative Feedback Loop and a Feedforward Loop
Author:
Affiliation:
1. Department of Electrical Engineering, Indian Institute of Technology Delhi, Hauz Khas, New Delhi, 110016, India
2. California Institute of Technology, Pasadena, California 91125, United States
Funder
Department of Science and Technology, Ministry of Science and Technology
Department of Electronics and Information Technology, Ministry of Communications and Information Technology
Publisher
American Chemical Society (ACS)
Subject
Biochemistry, Genetics and Molecular Biology (miscellaneous),Biomedical Engineering,General Medicine
Link
https://pubs.acs.org/doi/pdf/10.1021/acssynbio.0c00023
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1. The Bandgap Reference [A Circuit for All Seasons]
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