Ionization Probability in Molecular Secondary Ion Mass Spectrometry: Protonation Efficiency of Sputtered Guanine Molecules Studied by Laser Postionization-Reference-Cited by-同舟云学术

Ionization Probability in Molecular Secondary Ion Mass Spectrometry: Protonation Efficiency of Sputtered Guanine Molecules Studied by Laser Postionization

Published:2017-04-18 Issue:16 Volume:121 Page:8931-8937
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Popczun Nicholas J.¹^ORCID,Breuer Lars¹,Wucher Andreas²,Winograd Nicholas¹

Affiliation:

1. Department of Chemistry, The Pennsylvania State University, 104 Chemistry Building, University Park, Pennsylvania 16802, United States

2. Fakultät für Physik, Universität Duisburg-Essen, 47048 Duisburg, Germany

Funder

U.S. Department of Energy

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.7b01467

Reference34 articles.

1. The Magic of Cluster SIMS

2. Molecular ion imaging and dynamic secondary-ion mass spectrometry of organic compounds

3. Prospect of increasing secondary ion yields in ToF-SIMS using water cluster primary ion beams

4. Enhancing Ion Yields in Time-of-Flight-Secondary Ion Mass Spectrometry: A Comparative Study of Argon and Water Cluster Primary Beams

5. A mixed cluster ion beam to enhance the ionization efficiency in molecular secondary ion mass spectrometry

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