Carrier Pathway for Photoelectrochemical Water Oxidation with Intermediate State in n-type GaN Compared with Route of Anodic Corrosion-Reference-Cited by-同舟云学术

Carrier Pathway for Photoelectrochemical Water Oxidation with Intermediate State in n-type GaN Compared with Route of Anodic Corrosion

Author:

Fujii Katsushi¹²^ORCID,Goto Takenari³,Koike Kayo²⁴,Sugiyama Masakazu⁴⁵,Nakamura Shinichiro³^ORCID,Wada Satoshi²

Affiliation:

1. Global Solar Plus Initiative (GS+I), The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904, Japan

2. RIKEN Center for Advanced Photonics, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan

3. RIKEN Cluster for Science, Technology and Innovation Hub, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan

4. School of Engineering, The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656, Japan

5. Research Center for Advanced Science and Technology (RCAST), The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904, Japan

Funder

University of Tokyo

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

Reference28 articles.

4. Memming, R. Semiconductor Electrochemistry; Wiley-VCH, 2001, Chapter 7, pp 188–194.

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