Atomic-Scale Localized Thinning and Reconstruction of Two-Dimensional WS2 Layers through In Situ Transmission Electron Microscopy/Scanning Transmission Electron Microscopy-Reference-Cited by-同舟云学术

Atomic-Scale Localized Thinning and Reconstruction of Two-Dimensional WS2 Layers through In Situ Transmission Electron Microscopy/Scanning Transmission Electron Microscopy

Published:2020-06-09 Issue:27 Volume:124 Page:14935-14940
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Tseng Yi-Tang¹,Tai Kuo-Lun¹,Huang Chun-Wei²,Huang Chih-Yang¹,Wu Wen-Wei¹³⁴^ORCID

Affiliation:

1. Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu 30010, Taiwan

2. Material and Chemical Research Laboratories, Nanotechnology Research Center, Industrial Technology Research Institute, Hsinchu 31040, Taiwan

3. Frontier Research Center on Fundamental and Applied Sciences of Matters, National Tsing Hua University, Hsinchu City 30013, Taiwan

4. Center for the Intelligent Semiconductor Nano-system Technology Research, National Chiao Tung University, Hsinchu 30010, Taiwan

Funder

Ministry of Science and Technology, Taiwan

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.0c04765

Reference29 articles.

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3. Atom-by-atom fabrication with electron beams

4. Engineering single-atom dynamics with electron irradiation

5. Atomic‐Scale Fabrication of In‐Plane Heterojunctions of Few‐Layer MoS 2 via In Situ Scanning Transmission Electron Microscopy

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